Failure Analysis


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- Destructive Evaluation -

- Transmission Electron Microscopy -

CALCE partners with the Nanoscale Imaging Spectroscopy and Properties Lab (NISP Lab) at the University of Maryland. The NISP Lab, which is a part of University of Maryland's NanoCenter, houses three transmission electron microscopes (TEMs). The JEOL-2100F field emission TEM has a point-to-point resolution of 0.19 nm and is capable of elemental analysis (qualitative, quantitative as well as mapping) using the attached energy-dispersive x-ray spectrometer (EDS) or using the attached EELS spectral camera. The lab also houses a JEOL-2100 thermionic TEM with Lorentz imaging and in-situ capabilities (including specimen heating to 1000oC and cooling to 183oC). The third TEM is a JEOL 4000FX, which can be used to image samples at an accelerating voltage of 300 kV, which shows penetration ability.

Samples can be accepted in the TEMs as long as they fit within the standard sample geometry (3 mm discs less than 100 mm in thickness). Sample preparation techniques available within the lab include polishing stones, electrochemical polishing and ion-milling.


JEOL-2100F TEM

Introduction

Electrical Testing

Non-Destructive Evaluation

Destructive Evaluation

Microsectioning

Decapsulation/Delidding

*Optical Microscopy

*Scanning Electron Microscopy (SEM)

*Energy Dispersive Microscopy (EDS)

Focused Ion Beam (FIB) Imaging

*Scanning Magnetic Microscopy (SMM)

Transmission Electron Microscopy (TEM)

*Fourier Transform Infrared Spectroscopy (FTIR)

*Contact Resistance Measurements

Assessment of Popcorning in PEMs

*These techniques are also performed during