Tuesday, June 28 |
Topic |
Speaker |
Session 1 - Opening Sessions |
Symposium on Counterfeit Parts and Materials
|
Diganta Das, CALCE - University of Maryland |
Keynote talk 1: Counterfeit Electronic Parts - Observations and Insights from a US Defense Industry Perspective
|
Henry Livingston, BAE Systems |
SAE International Standards-Counterfeit Avoidance, Detection, Mitigation and Disposition
|
Bruce Mahone, SAE International |
Traceability As The Key Weapon Against Counterfeit � IPC 1782 Standard
|
Zac Elliott, Mentor Graphics |
Session 2 - Standards and Materials |
JEDEC�s New JESD243: Is It an Industry Standard for Counterfeit Electronic Parts - or Something Less?
|
Robert S. Metzger, Rogers Joseph O'Donnell., Mark Northrup, IEC |
Counterfeit Parts Standards and Certification
|
Dale Gordon, ANAB |
SAE AS6174A Counterfeit Materiel; "Assuring Acquisition of Authentic and Conforming Materiel"
|
Robert Tipton, Wyle |
|
Session 3: Directions and Solutions |
Recent Trends in Counterfeit Electronic Parts
|
Fred Schipp, Naval Surface Warfare Center, Crane |
Supply Chain Hardware Integrity for Electronics Defense (SHIELD) using Small "Dielets"
|
Len Chorosinski, Northrop Grumman ES |
Independent Distributors' Role in Securing the Supply Chain
|
Jason Jowers, Velocity Electronics |
Session 4 - Future Technologies |
Electronic Component Authentication Technology
|
Tom Bergman, Battelle |
Securing Your Supply Chain from Counterfeit Parts Through Real-Time, Electronic Chip Traceability
|
Phillip Zulueta, Special Consultant, Optimal Plus, Ltd., Yaacov De Russo, Director of Business Development, Optimal Plus, Ltd.
|
Leveraging the IoT for real-time identification and authentication of electronic parts and components
|
Louis Parks, SecureRF Corporation |
A Covert Solution to Protect Components, Assemblies and Products.
|
Mark Manning, iTRACE Technologies |
Maintenance Depot Counterfeit Detection Assessments Utilizing Electromagnetic Emission
|
Walter Keller, Nokomis |
Wednesday, June 29 |
Session 5: Defining Counterfeits |
Keynote Address 2: Getting Ready for Coming Deluge of Complex Cloned Devices
|
Thomas Sharpe, SMT Corp |
Understanding How ISO/IEC 17025 Areditation is Needed For AS6171
|
Anne Poncheri, AP Quality Consulting |
A Major Paradigm Shift � Replacement Part Manufacturers
|
Paula George, DLA |
Counterfeit or Nonconforming?: A Characterization of Errors We Make Today
|
Kevin Sink, TTI |
Session 6: Legal Issues |
Investigation and Prosecution of EPIC International Electronics
|
Brian Resler, US Department of Justice
|
The Importance of dealing with and being a Responsible Contractor
|
Keith Gregory, Snell & Wilmer
|
Session 7: Latest Technologies |
3D Printable Electronics and the Rise of the Counterfeiting Threat
|
Sharon Flank, InfraTrac
|
Laser Scanning Microscopy for Counterfeit Detection
|
Martine Simard-Normandin, MuAnalysis
|
The Next Challenge for X-Ray Counterfeit Detection: PCB Assemblies
|
Bill Cardoso, Creative Electron, Inc.
|
Session 8: Views Across Supply Chain |
Using FMEA As A support for A proactive Obsolescence Management
|
Andre Oliveira, Embraer S.A.
|
Parts Management Program for Obsolescence Management
|
Sultan Lilani, Integra Technologies
|
Customs and Border Control Issues from the Perspective of an Independent Distributor and its Counsel
|
Facilitated by Keith Gregory, Snell & Wilmer, Brett Johnson, Snell & Wilmer,Robb Hammond, AERI
|
Closing Observations
|
Diganta Das, CALCE - UMD
|
