JUNE 28 – 30, 2011

June 28-30, 2011
University of Maryland, College Park
College Park, MD

CALCE EPS Consortium members have access to the full presentations
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Day 1 - June 28, 2011
Session 1
Welcome and Introduction

Diganta Das, Ph.D., CALCE/University of Maryland
CBP IPR Enforcement

Kearly Neilson, Office of International Trade
An Update on the SAE G-19 Committee and Electronic Counterfeit Detection Standards
Anne Poncheri, Silicon Cert Laboratories
Session 2

Electronic Distribution Panel Discussion
TTI, Inc. - Insights - Kevin Sink
Digi-Key - Insights - Dave Doherty
Insights - Eric Williams
Industry's Role in Fighting Counterfeiting - Robin Gray

Robin Gray, NEDA

Kevin Sink, TTI
Dave Doherty, Digi-Key
Eric Williams, Arrow
Session 3
DNA to Safeguard Electrical Components & Protect Against Counterfeiting & Diversion

James Hayward, Applied DNA Sciences

Information Centric Covert Authentication Technology:
An Option for Seamless Integration into Existing Processes

TTP Vista – Enabling High security, Variable Data Solutions for Counterfeit Electronics

Peter Gabriele, Armark Authentication Technologies LLC
David P.H. Smith, The Technology Partnership
Authorized Recreation of Semiconductor Products

Daniel Deisz, Rochester Electronics
Session 4
CHIPSCANNER: Reverse Engineering Solution for Microchips at the Nanometer-Scale

Joseph Klingfus, Raith USA Inc
Counterfeit Trends - Increasing Difficulties in Detection

Mark Marshall, Integra Technologies LLC
Day 2 - June 29, 2011
Session 5
Alert Interoperability on Counterfeit and Common Component Problems
Larry DeFazio, QinetiQ Technology Extension Corporation (QTEC)
The Latest Counterfeit Processes Are Beginning to Move Away From The Traditional Methods And These Will Prove Much More Challenging to Detect

Tom Sharpe, SMT Corporation
Session 6
Progressive Obsolescence Management - Assuring Program Longevity
Denise Lingenfelter, Channel One International LLC.
Omega v Costco: Impact on Grey Market Protection Comparison to Other IP Laws

Milton Springut, Kalow & Springut LLP
Session 7
Panel Discussion of Recycling Moderator:
Barbara Kyle, Electronics TakeBack Coalition
Robert Houghton, Redemtech
Future Worries and Solutions
Diganta Das, Ph.D., CALCE/University of Maryland
Session 8
Supply Chain Management and Internal Inspection Techniques to Mitigate Counterfeit Component Impact
Gary Beckstedt, WorldMicro
New Technologies for the Detection of Counterfeit Components
Bill Cardoso, Creative Electron
Visual Inspection Criteria for Identifying Counterfeits
Donald Trenholm, Custom Analytical Services
Efforts to Fight Counterfeiting in the Information Technology Industry - The Role of the Independent Reseller
Neil Vill, World Data Products Inc.

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