Andrew Portune is a Principal Scientist at Nokomis, currently serving as the Advanced Detection of Electronic Counterfeit (ADEC) System technical lead. In addition to leading the ADEC development and maturation, he has been awarded SBIR Phase I and Phase II programs, where, serving as the Principal Investigator, he is developing novel non-destructive characterization technologies. He is listed as an inventor on five pending patents related to counterfeit detection and ultra-sensitive RF sensor systems.

Dr. Portune also serves on the SAE G19A tamper subgroup, where he is involved in developing a standard for Radiated Electromagnetic Emissions Analysis for counterfeit and IC tamper detection.