Tuesday, June 23 |
Topic |
Speaker |
Session 1 - Opening Sessions |
Symposium on Counterfeit Parts and Materials
|
Diganta Das, CALCE - University of Maryland |
Keynote: Functional Clones, The Most Dangerous NEW Counterfeit Threat Facing D&A Industry Manufacturing Today
|
Tom Sharpe, SMT Corporation |
Role of National IPR Center in Combating Counterfeit
|
Amy Turner, Diana Clemmons, ICE | Homeland Security Investigations | IPRC |
Counterfeit: An Aircraft Manufacturer Perspective
|
Andre Oliveira, EMBRAER S.A. |
Recent Trends in Counterfeiting of Electronic Parts (Analysis of ERAI Data)
|
Fred Schipp, US Navy |
Session 2 - Standards and Materials |
AS6081 Its Creation, Evolution, and Current Utilization by a Certified Distributor
|
Robb Hammond, AERI |
AS6496 Counterfeit Mitigation for Authorized Distribution
|
Kevin Sink, TTI Inc. |
SigNature� DNA Marking & Authentication for Traceability Applicable to a Diverse Range of Commodity Products
|
Janice Meraglia, Applied DNA Sciences |
|
Session 3 - Standards and Materials (continued) |
An Introduction to IDEA-QMS-9090
|
Lia Powell, IDEA |
Successful Joint Force Collaborative Effort to Correct Unacceptably Deficient Material Received for Installation Onboard Naval Assets
|
Karen Bruer, Amee Bay, LLC |
SAE G-21R AS6886 "Avoidance Of Counterfeit Refrigerant"
|
Paula George, DLA |
Session 4 - New Technologies |
Algorithms: The Next Frontier for X-Ray Inspection
|
Bill Cardoso, Creative Electron |
Quantitative Surface Authentication System For Counterfeit Mitigation Of Parts
|
Harshad Sardesai, Chromologic, LLC |
Anti-Counterfeiting for 3D Printing
|
Sharon Flank, InfraTrac |
Wednesday, June 24 |
Session 5 - Testing |
Homeland Security Investigation in Counterfeit Prevention
|
Special Agents Tonya Matney and Clay Townshend, DHS |
Most Open-Market Supplied Parts Come With Grossly-Insufficient Electrical Testing
|
Tom Sharpe, SMT Corporation |
Chip Recovery "ChiPR" Product: Breathing New Life Into Obsolescence
|
Marty Lanning, XTREME Semiconductor |
Cost Effective Electrical Testing for Risk Mitigation of Sophisticated Counterfeit ICs
|
Sultan Liliani, Integra Technologies |
Session 6 - Technology Solutions |
A holistic and pragmatic approach to integrated asset, parts marking and tracking
|
Jason Rushton, SICPA Product Security
|
Supply Chain Assurance Using ADEC Technology
|
Andrew Portune, Nokomis
|
Logical Vanishability for Counterfeit Prevention
|
Hassan Salmani, Howard University
|
Session 7 - Detection Programs |
AS6171 and Test Methods Standards
|
Mike Azarian, CALCE - UMD
|
Analysis of Information Sharing
|
Mark Snider, ERAI
|
Developing and Implementing a Counterfeit Mitigation Control Plan
|
Anne Poncheri, AP Quality Consulting LLC
|
SAE AS6174A Counterfeit Materiel; "Assuring Acquisition of Authentic and Conforming Materiel"
|
Bob Tipton, SAE G-21 chair
|
Session 8 - Closing Session |
Part Defects Related to Counterfeit - A Historical Review
|
Diganta Das, CALCE - UMD, Stephen Vaughn, CSC/GIDEP Support
|
Evaluation Of Product Authentication Technologies: A Detailed Evaluation Of The Current And Emerging Technologies
|
Yaw Obeng, NIST
|
Ceramic Taggants For Authentication or Provenance Marking
|
Brent McClaw, DataDot
|
Closing Remarks: Counterfeit Parts and Materials Symposium
|
Diganta Das, CALCE - UMD
|
