Tuesday, June 27 |
Topic |
Speaker |
Opening Remarks
|
Diganta Das, Ph.D., CALCE |
Session 1 : Opening Session - New Concerns and Response |
Keynote talk 1: "Cloned" Devices - How Similar or Different Are Those from Originals
|
Thomas Sharpe, SMT Corp |
SAE and its Role in Developing Suite of Counterfeit Electronics and Materiel Avoidance Standards
|
Judith Ritchie, SAE International |
Session 2 - Standards Development to Fight Counterfeit |
Risk Assessment in SAE 6171
|
Michael Azarian, Ph.D., CALCE |
JESD-243, Who is it Intended to Serve
|
Lee Mathiesen, Lansdale Semiconductor Inc. |
Meeting the 'Risk Assessment' Requirements of ISO 9001:2015, AS9100D or AS9120B
|
Anne Poncheri, InterCEPT |
|
Session 3: Panel Discussion on Role of Test Laboratories in Reporting |
Session 4 - Future Technologies for Tracking and Detection |
Supply Chain Hardware Integrity for Electronics Defense (SHIELD) using Small "Dielets"
|
Len Chorosinski, P.E., Northrop Grumman ES |
Barricade: Authentication Testing of Integrated Circuits through Power Consumption Waveform Analysis
|
Tom Bergman, Battelle
|
Advanced Detection of Electronic Counterfeits (ADEC) for Enhanced Supply Chain Assurance Against Sophisticated Counterfeits
|
Andrew Portune, Ph.D., Nokomis, Inc. |
Counterfeit Detection Using Power Spectrum Analysis
|
Guillermo Loubriel, Ph.D.,Sandia National Laboratories |
Wednesday, June 28 |
Session 5: Counterfeits in Electronic Product Life Cycle |
Keynote Address 2: An Overview of Historical Trends Relating to Suspect Counterfeit, Non-Conforming and High Risk Electronic Components
|
Mark Snider, ERAI |
The Authorized Bonafides - Definitions Matter
|
Dan Deisz, Rochester Electronics |
Existing Obsolescence Prediction Models Are Now Obsolete
|
Bill Fliegel, MBA, Converge, an Arrow Company |
Special Plenary Talk: A Systems Engineering Approach to Cyber Physical Systems Security
|
Prof. John Chandy, Ph.D. UConn Center for Hardware Assurance, Security and Engineering |
Session 6: Detection of Counterfeit Parts |
Supply Chain Maintenance Using Reverse Engineering
|
Bill Cardoso, Ph.D., Creative Electron, Inc.
|
Inspection Tool and Techniques for Detecting Counterfeit Parts
|
Peter Panaguiton, GIDEP
|
Session 7: Tracking Parts Through Supply Chain |
Deployed Forensic Cloud-Based Track & Trace Platform
|
Bob MacDowell, Applied DNA Sciences
|
JTAG Interrogator to Validate Electronic Parts
|
Ryan Jones, Corelis Inc.
|
Fraudulent Parts Reduction via RFID-Enabled Drone Inventory Management and Supply Chain Optimization
|
Latasha Taylor Starr, University of Texas at Arlington
|
Session 8: Visit with Exhibitors |
Tiered Approach Sourcing of Electronics and DFARS Clause 252.246-7008
|
David Archibeque and
John Petty, IEC Electronics
|
What is an Authorized Aftermarket Manufacturer
|
Lee Mathiesen, Lansdale Semiconductor Inc.
|
Panel Discussion: Lessons from the Industry
|
Sally Arno, Freedom Sales
Jerry Martinez, NASA
Bob Tipton, Wyle
|
Closing Observations
|
Diganta Das, Ph.D., CALCE
|
