|
June 27–29, 2017
The College Park Marriott Hotel and Conference Center College Park, MD |
|
Click here to register
Definitions of Authenticity, Commercial Traceability, Reliability, and Quality
Dan Deisz (ddeisz@rocelec.com)
Bio
Dan Deisz got his B.S.E.E. from the University of Alabama in 1984 and has more than 25 years' experience in design engineering, technology marketing, and engineering management. Dan started his career at Harris Government Systems in Melbourne, Florida, doing digital design. In his 20 years at LSI Logic from 1987 through 2007, he supported several hundred ASIC designs through the signoff process, managed all the North American Design Centers, and ended his tenure in Technology Marketing. Dan currently manages the Design Group at Rochester Electronics and is based out of their Rockville, Maryland, office. Previous publications include US patent 7424696 and patent application 20090285261.
Abstract
This presentation will go through critical definitions of Authenticity, Commercial Traceability, Reliability, Quality, and the Authorized Aftermarket so that the attendees will have a better understanding of the metrics required to ensure mission-critical components are appropriately being purchased. One of the bigger mistakes being made today in component procurement is associating or confusing Authenticity with Reliability and Quality. Nothing could be further from the truth. OCM test will be touched upon so there is an appreciation for the complexity of what the OCM’s do when they test a component – highlighting how different this is from a purely datasheet testing approach. This presentation will also attempt to clarify the many flavors of “Authorized” to try and shine a light on the ambiguities within the market and more specifically the Authorized Aftermarket.
About Rochester Electronics
Rochester Electronics offers a solution for mature and end-of-life semiconductors. Rochester provides the semiconductor industry with an authorized, guaranteed source of supply for long-lifecycle applications.