Day 1 - December 04, 2012 |
Topic |
Speaker |
Session 1 |
Opening : Counterfeit Electronic Parts and Electronic Supply Chain Symposium |
Diganta Das, CALCE, University of Maryland |
Keynote: Counterfeit Parts & Supply Chain Risk Management: Answering The Challenge
Associated Documents:
1.Legislating Supply Chain Assurance
2.Counterfeit Parts
3.Counterfeit Electronics Parts
|
Robert S. Metzger, Rogers Joseph O'donnell |
Managing Counterfeit Risk in the Department of Defense (The online version of symposium presentation is not available)
|
Brian Cohen, Institute for Defense Analyses |
Business Practices: JPL’s Process for Avoiding Counterfeit Electronic Parts
|
Lori Risse, Jet Propulsion Laboratory |
Session 2 |
Passive Component Locating
|
Robin Gray, ECIA
|
Implementing the Details of a Successful Counterfeit Risk Mitigation Program
|
Rick Roelecke, L-3 Communications Corporation
|
Initial Material Qualification Must be Reinforced With Periodic Verification Testing Throughout the Product Life Cycle Due To Supplier Noncompliance & Suspect Counterfeiting
|
Bob Vermillion, RMV Technology Group, LLC
|
Session 3 |
Overview of the Department of Commerce and Senate Arms Committee Findings Regarding Counterfeit IC’s in the DoD Supply Chain
|
Dave Loaney, Premier Semiconductor Services |
Data Fusion for Augmented Counterfeit Detection Efficacy (The online version of symposium presentation is not available)
|
Bill Cardoso, Ph.D., Creative Electron with SpaceX |
Considerations Before Adopting any External Taggants for Part Authentication
|
Steve Hirschfeld, Rochester Electronics |
Session 4 |
Cloning Concerns (The online version of symposium presentation is not available)
|
Tom Sharpe, SMT Corporation |
DNA Marking to Assure Product Authenticity
|
James Hayward, Ph.D., Applied DNA |
Functional and Silicon Biometrics Test to Verify Component Authenticity |
James Lewis, Lewis Innovative Technologies, Inc. |
A Cryptographic Solution For Supply-Chain Assurance of Intelligent ICS
|
Ming-Hoe Kiu, Microsemi |
Day 2 - December 05, 2012 |
Session 5 |
Assessing Sourcing Strategies For Long Life Cycle Products Subject To Long-Term Supply Chain Disruptions
|
Peter Sandborn, University of Maryland |
Cross-Industry Sustainment and Mitigating Obsolescence Counterfeit Risk |
Kaye Porter, GDCA |
Avoiding Counterfeits When Addressing Component Obsolescence |
David Steele, DA-TECH Corporation |
Session 6 |
Assessing Sourcing Strategies For Long Life Cycle Products Subject To Long-Term Supply Chain Disruptions
|
Todd Kramer, Secure Components |
Cross-Industry Sustainment and Mitigating Obsolescence Counterfeit Risk |
Louis Parks, SecureRF Corporation |
Avoiding Counterfeits When Addressing Component Obsolescence |
Rob Leibrandt, Camcode |
Session 7 |
Counterfeit IC Avoidance Techniques for Today's High Performance Memories and Microprocessors |
Sultan Lilani, Integra Technologies |
What Information Can Be Found After Decapsulation
|
Erik Jordan, Nisene Technology |
Materials Properties is the Key to Authentication
|
Bhanu Sood, Ph.D., CALCE-UMD |
Session 8 |
Radiography Techniques and Strategies for Counterfeit Detection
|
Bill Cardoso, Creative Electron |
An Effective Method for Detecting Counterfeit Components
|
Tom Peters, Qualmark |
Closure: Are We at the End of the Counterfeit Electronics Concerns?
|
Diganta Das, Ph.D., CALCE-UMD |
Day 3 - December 06, 2012 - WORKSHOPS |
WS1: Counterfeit Part Avoidance and Detection
|
Diganta Das and Bhanu Sood, CALCE |
WS2: Managing Electronic Part Obsolescence
|
Peter Sandborn, CALCE |
WS4: Integration of Counterfeit Mitigation Policies into Quality Programs
|
Edward Dimmler, Creative Electron |