Counterfeit Electronic Parts &
Electronic Supply Chain Symposium
December 4 – 6, 2012

Crowne Plaza Anaheim Resort, Garden Grove (Anaheim), CA



CALCE EPS Consortium members may use their CALCE Web Accounts to access the full presentations.

If you attended the symposium and are not a member, you will need to register for a web account.

If you did not attend the sysmposium and would like access presentation, you will need to obtain a CALCE Articles Account

 

Day 1 - December 04, 2012
Topic
Speaker
Session 1
Opening : Counterfeit Electronic Parts and Electronic Supply Chain Symposium Diganta Das, CALCE, University of Maryland
Keynote: Counterfeit Parts & Supply Chain Risk Management: Answering The Challenge
Associated Documents:
1.Legislating Supply Chain Assurance
2.Counterfeit Parts
3.Counterfeit Electronics Parts
Robert S. Metzger, Rogers Joseph O'donnell
Managing Counterfeit Risk in the Department of Defense
(The online version of symposium presentation is not available)


Brian Cohen, Institute for Defense Analyses
Business Practices: JPLís Process for Avoiding Counterfeit Electronic Parts


Lori Risse, Jet Propulsion Laboratory
Session 2

Passive Component Locating

Robin Gray, ECIA

Implementing the Details of a Successful Counterfeit Risk Mitigation Program

Rick Roelecke, L-3 Communications Corporation

 

Initial Material Qualification Must be Reinforced With Periodic Verification Testing Throughout the Product Life Cycle Due To Supplier Noncompliance & Suspect Counterfeiting

 

Bob Vermillion, RMV Technology Group, LLC


 

Session 3
Overview of the Department of Commerce and Senate Arms Committee Findings Regarding Counterfeit ICís in the DoD Supply Chain


Dave Loaney, Premier Semiconductor Services
Data Fusion for Augmented Counterfeit Detection Efficacy
(The online version of symposium presentation is not available)


Bill Cardoso, Ph.D., Creative Electron with SpaceX
Considerations Before Adopting any External Taggants for Part Authentication


Steve Hirschfeld, Rochester Electronics
Session 4
Cloning Concerns
(The online version of symposium presentation is not available)
Tom Sharpe, SMT Corporation
DNA Marking to Assure Product Authenticity


James Hayward, Ph.D., Applied DNA
Functional and Silicon Biometrics Test to Verify Component Authenticity James Lewis, Lewis Innovative Technologies, Inc.
A Cryptographic Solution For Supply-Chain Assurance of Intelligent ICS


Ming-Hoe Kiu, Microsemi
Day 2 - December 05, 2012
Session 5
Assessing Sourcing Strategies For Long Life Cycle Products Subject To Long-Term Supply Chain Disruptions
Peter Sandborn, University of Maryland
Cross-Industry Sustainment and Mitigating Obsolescence Counterfeit Risk Kaye Porter, GDCA
Avoiding Counterfeits When Addressing Component Obsolescence David Steele, DA-TECH Corporation
Session 6
Assessing Sourcing Strategies For Long Life Cycle Products Subject To Long-Term Supply Chain Disruptions
Todd Kramer, Secure Components
Cross-Industry Sustainment and Mitigating Obsolescence Counterfeit Risk Louis Parks, SecureRF Corporation
Avoiding Counterfeits When Addressing Component Obsolescence Rob Leibrandt, Camcode
Session 7

Counterfeit IC Avoidance Techniques for Today's High Performance Memories and Microprocessors

Sultan Lilani, Integra Technologies

What Information Can Be Found After Decapsulation

Erik Jordan, Nisene Technology

Materials Properties is the Key to Authentication

Bhanu Sood, Ph.D., CALCE-UMD
Session 8
Radiography Techniques and Strategies for Counterfeit Detection
Bill Cardoso, Creative Electron
An Effective Method for Detecting Counterfeit Components
Tom Peters, Qualmark
Closure: Are We at the End of the Counterfeit Electronics Concerns?
Diganta Das, Ph.D., CALCE-UMD
Day 3 - December 06, 2012 - WORKSHOPS
WS1: Counterfeit Part Avoidance and Detection
Diganta Das and Bhanu Sood, CALCE
WS2: Managing Electronic Part Obsolescence
Peter Sandborn, CALCE
WS4: Integration of Counterfeit Mitigation Policies into Quality Programs
Edward Dimmler, Creative Electron




Sponsored By:

Endorsed By:

Circuits Assembly