Counterfeit Electronic Parts and Electronic Supply Chain Symposium Technical Program

Counterfeit Electronic Parts & Electronic Supply Chain Symposium

November 19-21, 2013

Town & Country Resort,
San Diego, CA

Technical Program
Program Chair: Dr. Diganta Das, CALCE (diganta@umd.edu)

CALCE EPS Consortium members have access to the full presentations.
Symposium Attendees may request access to the material by filling out the SCEP 2013 Attendee Registration Form (please type SCEP 2013 West Attendee in the comment field).

If you are not a member or attendee, you will need to register for Articles access account.

Tuesday, November 19
Topic	Speaker
Session 1 - Supply Chain Management
Opening Remarks	Diganta Das, Ph.D., CALCE - University of Maryland
How the Department of Homeland Security Defends Our Country Against Counterfeited Goods	Hector Perea, Immigration and Customs Enforcement
An Overview of Historical Trends and a New Manner of Counterfeiting	Mark Snider, ERAI
Session 2 - OCMs and Franchised Distributors
The Authorized Channel's Response to Counterfeiting	Robin B. Gray, Jr., ECIA
Fraudulent/Counterfeit Electronic Parts: Avoidance, Detection, Mitigation, and Disposition, Authorized/Franchised Distribution	Chuck Amsden, Jr., Mouser
Winning the Battle Against ©unterfeit Semiconductor Products	Ron Davis, Qualcomm
Anti-Counterfeiting Efforts	Dustin Todd, Semiconductor Industry Association
Session 3 - Independent Distributors
Counterfeit Electronic Components from a Test Lab Perspective	Dave Loaney, Premier
Holistic Supply Chain Security	Jason Jowers, Velocity Electronics
Independent Distribution's Responsibility - Assess and Authenticate the Components	Scott McKee, 4Star
Session 4 - Inspection Methods and Tools
Review of US Export Control Laws A Guide To Export Enforcement (Document distributed by ICE/DHS)	Joshua Bass, Immigration and Customs Enforcement
External Packaging Evaluation for Counterfeit Risk Detection	Bhanu Sood, CALCE - UMD
Inspection Qualification and Certification Tools: Meeting Industry Expectations	Debra Eggeman, IDEA
Wednesday, November 20th
Session 5 - Legal and Technology Solutions
10 Ways to Find Counterfeit Components Using X-rays	Bill Cardoso, Creative Electron
Sample Preparation for Internal Evaluation	Erik Jordan, Nisene
Ceramic Taggants for Authentication or Provenance Marking of Electronic Components	Brent McLaws, DataDot Technology
Signature DNA Marking	Janice Meraglia, Applied DNA Sciences
Session 6 - Technology Solutions
Low Cost, Real Time Authentication of Individual Legacy Components	Dr. Richard McDermott, SignaKey LLC
Utilization of a PUF to Authenticate and Track a Product	Philippe Mathevon, Advanced Track & Trace
Outer ESD Packaging Container Issues	Bob Vermillion, RMV Technology Group
Session 7 - In-built Authentication
Non-Invasive Optical Analysis Technology, DTEK	Skylar Gauss, Covisus Mike Solis, The Boeing Company
Material Based Authentication	Diganta Das, Ph.D., CALCE, University of Maryland
Session 8 - Panel Discussion
Introduction to SAE AS6171 AS6171 -Method I - Techniques for Suspect/Fraudulent /Counterfeit EEE Part Detection by External Visual Inspection Status of AS6171 Detection by Delid/Decapsulation Physical Analysis Methods Method II: X - Ray Fluorescence (XRF)	Moderator: Bill Cardoso, Ph.D., Creative Electron Panelists: Dave Loaney, Premier Sultan Lilani, Integra Erik Jordan, Nisene Bhanu Sood , CALCE
Are We at the End of the Counterfeit Electronics Concerns?	Diganta Das, Ph.D., CALCE - UMD
Thursday, November 21 (Workshop)
Counterfeit Part Avoidance and Detection	Diganta Das, Ph.D., CALCE - UMD Bhanu Sood , CALCE