Presented On: December 2-3, 2009
Presented At: Samuel Riggs Alumni Center
University of Maryland, College Park, MD 20742

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Agenda

Session I: Introduction and Scope
Welcome and Introduction	Dr. Diganta Das, CALCE, University of Maryland
The Scope and Magnitude of the Problem	Mark Crawford, US Department of Commerce
Counterfeiters Techniques are Constantly Improving to Avoid Detection – Our National Security is Dependent on Us to Keep Up	Tom Sharpe, SMT Corporation
AS5553 – A New Standard in the Fight Against Counterfeit Parts	Dan DiMase, Honeywell
International Property Rights Enforcement in the Electronics Industry	Craig Thurber, U.S. Immigration & Customs Enforcement
Session II: Legal and Law Enforcement Issues
Intellectual Property – The Primary Legal Principle Behind Counterfeit Definitions	Prof. Patricia Campbell, University of Maryland
Counterfeit Components and Related Legal Issues	Laurence E. Pappas, Channel One Group
Setting up Anti-Counterfeiting Technologies that will Stand Up in Court and are Cost Effective	David Kalow, Kalow & Springut LLP
Global Perspective on Intellectual Property Issue	Tim Trainer, Global Intellectual Property Strategy Center, P.C.
Counterfeit Parts Avoidance Training for EEE Parts	CALCE Workshop
Anti-Counterfeiting: The Powers That Be – An IP and Legal Perspective	CALCE Workshop
Physical, Material, and Electrical Testing Techniques in the Laboratory to Identify and Mitigate EEE Counterfeit Risk	CALCE Workshop
December 3, 2009
Session III: Supply Chain Perspective
Counterfeit Electronics – It is Beyond Components	Dr. Diganta Das, CALCE / University of Maryland
Quality & Reliability Issues with Counterfeit ICs	Andrew Olney, Analog Devices
Franchised Distribution Role to Mitigate Risk Associated with Counterfeit Parts	Bill Palladino, Arrow Electronics
Independent Distributor Perspective: Challenges & Solutions to Mitigate Counterfeit Parts	Steve Calabria, Independent Distributors of Electronics Association (IDEA)
Risk Mitigation Tools to Address Today's Complex Global Marketplace	Mark Snider, ERAI, Inc.
Session IV: Technical Tools and Methods
Laser Surface Authentication: Natural Randomness as a Fingerprint for Product Authentication	Mark McGlade, Ingenia Technology Limited
Electrical Testing for Counterfeit Detection	Mark Marshall, Integra Technologies
Understanding Industry Perspective in the FAR Council Effort to Create Assurance in the Supply Chain	Trey Hodgkins, TechAmerica
First Line of Defense Against Counterfeits	Robb Hammond, American Electronic Resource, Inc.
Supply Chain Panel Discussion Industry Recommendations on Mitigating the Risk Posed by Counterfeit Parts Mitigating the Risk of Counterfeits: Approaches & Challenge IDEA Contributions to Mitigate Counterfeit Parts	Moderator: Lisa Gardner, Government Accountability Office Panelists: Lonnie Hurst, Intel Corporation; Art Mester, Boeing Company; Bill Palladino, Arrow Electronics; Tom Sharpe, SMT Corporation; Mark Snider, ERAI
Session V: Government and Defense Perspective
The Black Swan Effect	Jack Stradley, Rochester Electronics
Counterfeit Parts Risk Mitigation	Charlie Whitmeyer, Orbital Sciences Corporation
Mitigating Counterfeit Issues through GIDEP	Robert Karpen, GIDEP
Microelectronic and Semiconductor Vulnerabilities, a Defense Supply Center Columbus (DSCC) Approach	Ernest Reid and Michael Adams,Defense Logistics Agency
Industry Recommendations on Mitigating the Risk Posed by Counterfeit Parts	Art Mester, Boeing Company
The Way Forward	Brian Hughitt, NASA