Tuesday, June 24 |
Topic |
Speaker |
Session 1 - The Past and the Future |
Opening Remarks
|
Diganta Das, Ph.D., CALCE - University of Maryland |
NASA and US Government Initiatives to Mitigate the Counterfeiting Threat
|
Brian Hughitt, NASA, Office of Safety and Mission Assurance |
Direction of Counterfeiting in with Historical Perspective
|
Kirsten Koepsel, Consultant |
Clones - The Final Frontier of the Component Counterfeiter..?
|
Thomas Sharpe, SMT Corporation |
Session 2 - Supply Chain Protection |
Market Dynamics and Technical Limits of Cloning, Obsolescence, and Counterfeit
|
Dan Deisz, Jr., Rochester Electronics |
SAE Counterfeit Mitigation standards for the electronics industry
|
Anne Poncheri |
Session 3 - Beyond Electronics and Counterfeiting |
Counterfeit Materials and Products in the Construction Supply Chain
|
Edward Minchin, University of Florida |
The Dodd-Frank Act and its implications for the Electronics Supply Chain
|
Randy Daugharthy, Bureau Veritas |
Cyber Physical Systems Security, a Systems Engineering Perspective
|
Dan DiMase, Honeywell Aerospace |
Session 4 - Panel on Detection Techniques |
Presentations: Erik Jordan, Bill Cardoso, Sultan Ali Lilani, Walter Keller, Scott Moser
|
Moderator: Bhanu Sood |
Wednesday, June 25 |
Session 5 - The Standards, Legal and Regulatory Framework |
Investigating and Prosecuting Cases Involving Counterfeit Electronic Parts: Working with Law Enforcement
|
Matthew Lamberti, US Department of Justice |
Convergence of Counterfeit and Cyber Threats: Understanding New Rules on Supply Chain Risk
|
Jeffery Chiow, Rogers Joseph O'Donnell, PC |
Analysis of GIDEP Data for Counterfeit Part Detection Trends
|
Fred Schipp, Navy/MDA |
Session 6 - Panel Discussion on Authentication Techniques |
Presentations: Janice Meraglia, Sharon Flank, Richard McDermott
|
Moderator: Diganta Das
|
Session 7 - Link through Obsolescence |
Design Refresh as a Solution
|
Peter Sandborn, UMD
|
Counterfeiting Supply Chain Security Cyber Threat
|
Janice Meraglia, Applied DNA Sciences
|
Session 8 - Using Part Characteristics for Detection |
Material Database for Counterfeit Detection Support
|
Diganta Das, Bhanu Sood
|
Advanced Physical Inspection Methods for Counterfeit Detection
|
Sina Shahbazmohamadi, AUniversity of Connecticut (CHASE)
|
Usage of Process Dependent Random Inaccuracies as Tracking Marks
|
Matthias Steiert, University of Freiburg
|
Closing Remarks - What Have We Learned
|
Diganta Das, UMD
|