Failure Threat Caused by Counterfeit Parts and Effort Made by the Chinese
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Youliang Wang (wangyl@ceprei.com) of CERPEI will present on Failure Threat Caused by Counterfeit Parts and Effort Made by the Chinese at the CALCE SMTA conference at College Park, Maryland on June 25th.
Abstract:
Counterfeit parts have been a growing concern in recent years because of several factors, including demand increase for reducing costs and a contradiction between rapid obsolescence of electronic parts and the long life cycle of products. The Chinese government has been making great effort to control the counterfeit parts. Through years of working in failure analysis and destructive physical analysis, professionals in China's CEPREI Lab. have accumulated much valuable experience and cases. In this work, some typical failure analysis cases are shared to showcase the defects/degradation inherent in counterfeit plastic encapsulated microcircuits.
China Electronic Product Reliability and Environmental Testing Research Institute, established in 1955, is a scientific research organization engaging in product quality and reliability research in China. China CEPREI Laboratory provides services on product testing, analysis, evaluation, certification, calibration, information services, technical training, special equipment and software development for components or equipment as well as large hardware or software complex system. As the affiliated institute directly under the Ministry of Industry and Information Technology, CEPREI provides technical support and services not only for industrial management of MIIT and local government, but also for over 10,000 electronic information companies every year.
Counterfeit parts have been a growing concern in recent years because of several factors, including demand increase for reducing costs and a contradiction between rapid obsolescence of electronic parts and the long life cycle of products. The Chinese government has been making great effort to control the counterfeit parts. Through years of working in failure analysis and destructive physical analysis, professionals in China's CEPREI Lab. have accumulated much valuable experience and cases. In this work, some typical failure analysis cases are shared to showcase the defects/degradation inherent in counterfeit plastic encapsulated microcircuits.
China Electronic Product Reliability and Environmental Testing Research Institute, established in 1955, is a scientific research organization engaging in product quality and reliability research in China. China CEPREI Laboratory provides services on product testing, analysis, evaluation, certification, calibration, information services, technical training, special equipment and software development for components or equipment as well as large hardware or software complex system. As the affiliated institute directly under the Ministry of Industry and Information Technology, CEPREI provides technical support and services not only for industrial management of MIIT and local government, but also for over 10,000 electronic information companies every year.