Day 1 - June 26, 2012 |
Topic |
Speaker |
Session 1 |
| Opening : Counterfeit Electronic Parts and Electronic Supply Chain Symposium |
Diganta Das, CALCE, University of Maryland |
A Look at the Statistics on Counterfeiting: What Do We Really Know? (This online version of presentation is abridged from the symposium presentation)
|
Kirsten M. Koepsel, AIA |
Trademark Counterfeiting in China
|
Patricia E. Campbell, University of Maryland Law School |
Session 2 |
JPL's Process for Avoiding Counterfeit Parts
|
Lori Risse, NASA JPL
|
Automated Counterfeit Electronic Component Warning System and Corporate Case Studies
|
Bill Crowley, QTEC
|
Supporting Long-Lasting Embedded Applications: Counterfeits are the Symptom – Obsolescence is the Illness
|
Ethan Plotkin, GDCA
|
| Avoiding Counterfeits When Addressing Component Obsolescence |
Chrys Shea, DA-TECH |
Session 3 |
US DoJ Led Panel Presentations (The online version of presentations is abridged from the symposium presentations)
|
Sherri L. Schornstein (Assistant U.S. Attorney) with Andrew Olney (Analog Devices), Fred Schipp (MDA), Therese Randazzo (CPB-DHS) and William G. Ross(ICE-DHS) |
Session 4 |
| New Design Methodologies for Counterfeit Detection and Prevention (Presentation not available as per author's request) |
Mohammad Tehranipoor, University of Connecticut |
Unique Method of Preventing Counterfeiting in Oscillators and More
|
Keith Rouse and James Magos, Cardinal Components Inc. |
| DNA Marking to Assure Product Authenticity |
Janice Meraglia/ Alex Tran, Applied DNA |
Spectroscopically-Detectable Chemical Coding of Polymers
|
Sharon Flank, InfraTrac |
| Functional and Silicon Biometrics Test to Verify Component Authenticity |
James Lewis, Lewis Innovative Technologies, Inc. |
Day 2 - June 27, 2012 |
Session 5 |
FY2012 NDAA Section 818: Detection and Avoidance of Counterfeit Electronic Parts - Implications for Contractors
|
Henry Livingston, BAE Systems |
| AS6081 – "Counterfeit Electronic Parts Avoidance – Distributors" - Requirements and Implementation |
Anne Poncheri, Silicon Cert Laboratories |
| International IECQ Conformity Assessment System, IECQ 03-7 |
Stanley Salot Jr, ECC Corp |
| Anti-Counterfeiting Cloud System for Multiple Industries |
Soshi Hamaguchi, CosmosCorp. |
Session 6 |
Panel Discussion: The Impact of the Standards and Regulations on the Independent Distributor and Broker Market
US CUSTOMS PROCEDURES: Counterfeit Imports
Combating Counterfeit Components
Corporate Quality and Services Presentation
|
Keith M. Gregory and Richard Katz, (Snell & Wilmer L.L.P.), with Marty Lanning (Xtreme Semiconductor) and Gilles Aouizerat (PCX Inc.). |
Session 7 |
The iNEMI Project on Counterfeit Components – Assessment Methodology and Metric Development |
Robert Pfahl, iNemi (with Plexus, IBM, Agilent, Celestica, and IST Group) |
An Assessment of Counterfeit Detection and Confirmation Technologies
|
Brian Cohen, DoD and Don Davidson, IDA |
Session 8 |
New Developments in the Fight on Counterfeit Components
|
Dave Loney, PremierSemiconductor Services LLC |
Radiation Effects on Electronic Components (This online version of presentation is abridged from the symposium presentation)
|
Bill Cardoso, Creative Electron |
What Information Can be Found After Decapsulation (This online version of presentation is abridged from the symposium presentation)
|
Erik Jordan, Nisene Technology Group |
Closure: : Are we at the End of the Counterfeit Electronics Concerns?
|
Diganta Das, CALCE, University of Maryland |
