Counterfeit Symposium 2026

June 23-25, 2026,
University of Maryland, USA


Access to the presentations is limited to the symposium attendees and subscribers through SMTA. If you have attended the event or purchased proceedings access from SMTA, please request access here. CALCE Electronic Product and System Consortium Members have access to the proceedings using their CALCE member credentials.


Tuesday, June 23
Session 1: Opening Session Moderator: Diganta Das
Registration
Opening Remarks Tanya Martin (Executive Director, SMTA)
Twenty Years of Securing Supply Chain – SMTA/CALCE Symposium Diganta Das, PhD, University of Maryland, Program Chair
Keynote Talk: Investing in a Robust Semiconductor Ecosystem: The UMD Story Ankur Srivastava, PhD, University of Maryland
“The Numbers Crunch” Counterfeit Reporting Trends 2025 Richard Smith, ERAI
Session 2: Are Trusted Sources Going to Help Technology Development and Counterfeit Reduction Moderator: Cameron Shearon, Raytheon
Expanding Trusted Microelectronics: Meeting Future Needs David Chesebrough, Defined Business Solutions
Design for Sourcing: a Method to Secure Your Supply Chain Ed Dodd, Cofactr
AI for Provenance and Traceability: Countering Counterfeit Risk in Semiconductor Supply Chains Jeremy Muldavin, PhD, Cadence
Session 3: Technology Tools for Avoidance Moderator: Nicholas Williams, PhD, SMT Corp.
AI Enhanced Physical Inspection for Counterfeit Microelectronics Charles Woychik, PhD, NHanced Semiconductors
A Novel Anti-Counterfeiting Technology for Semiconductor Supply Chains Using Inkjet-Printed Silicon Nanoparticle Ink Tadatomo Yamada, LINTEC Corporation
Session 4: Standards Moderator: Kevin Sink, TTI
Overview of Anti-Counterfeit Aerospace Standards Jim Creiman, SAE
An Overview of the Revision of SAE AS6171: Standard for Detection of Counterfeit EEE Parts Michael Azarian, PhD, CALCE, University of Maryland
Advanced Detection Techniques for Counterfeit Electronic Components Nicholas Williams, PhD, SMT Corp.
An Introduction to the SAE Online Tool for AS6171 Test Set Selection Michael Azarian, PhD, CALCE, University of Maryland

 

Wednesday, June 24
Registration
Session 5: Standards and Implementation Moderator: Scott McKee, 4 Star Electronics
Anti-Counterfeit Aerospace Standards for non-EEE Materiel Jim Creiman, SAE
Better Results Through Better Analysis enabled by Standards Cameron Shearon, Raytheon
Analyze the Risk. Prove the Part. A Unified Counterfeit Mitigation Strategy Lam Nguyen, CEO and Founder, chipsID LLC
Session 6: Detection Cases Moderator: Anthony Mestre, Micross
NASA Electrical, Electronic, Electromechanical, Electro-Optical (EEEE) Parts Selection Process Lyudmyla (Panashchenko) Ochs, NASA Goddard Space Flight Center
Inside Commercial AA & AAA Batteries: Structural and Electrical Variability Revealed by X-Ray and Discharge Testing Morgan Stanul, MuAnalysis
A Telemetry-Guided DDR/GDDR Integration Testing and Data-Driven Diagnosis Cong Xu, Global Electronic Test Services
Session 7: Standards and Laboratory Moderator: Dr. Diganta Das
Panel Discussion on Implementation of Standards and Laboratories Panelists include: Nicholas Williams, PhD, SMT Corp.; Anthony Mestre, Micross; and Dr. Michael Azarian, PhD, CALCE, University of Maryland.
Session 8: Distribution and Closing Moderator: Dr. Diganta Das, PhD, University of Maryland
Hidden Price Tag of Counterfeit Electronics Paula George (Retired DLA) with Dan DiMase and Steve Walters (Aerocyonics, Inc.)
Evaluating Risk When Evidence Diverges: A Counterfeit Case Study Dane Reynolds, Astute Electronics Inc.
Panel: The Return to an Era of Allocation of Components and Long Lead Times Moderator: Kevin Sink, TTI Panelists include: John Alden, Avnet; James Turner, Yageo Kemet; Todd Zara, TTI
Learnings from this year's event. Moderator: Dr. Diganta Das and the Techncial Committee Members

 

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