Counterfeit Parts and Materials Symposium 2025

June 24-26, 2025,
University of Maryland, USA


Access to the presentations is limited to the symposium attendees and subscribers through SMTA. If you have attended the event or purchased proceedings access from SMTA, please request access here. CALCE Electronic Product and System Consortium Members have access to the proceedings using their CALCE member credentials.


Tuesday, June 24
Session 1: Opening Session
Opening RemarksDr. Diganta Das (Program Chair) and Tanya Martin (Executive Director, SMTA)
Keynote Talk: Microelectronics Powering America's DefenseMatthew Hicks, Northrop Grumman
Data Crunch - 2024Richard Smith, ERAI
Session 2: Trusted Sources
Reducing Counterfeit Risk Through the Use of DoD Trusted SuppliersDavid Chesebrough, Defined Business Solutions
Panel Discussion on Reducing Counterfeit Risk Through the Use of DoD Trusted SuppliersModerator: David Chesebrough, Defined Business Solutions.
Panelists: Sultan Lilani, Integra; Calvin Chu, Chip Scan; and Dave Lawson, Northrop Grumman
Session 3: Technology
How to Use Side-Channel Assessment to Detect Counterfeit MicroelectronicsDevon Richman, University of Maryland
Rapid, Non-Destructive Detection of Counterfeit Integrated Circuits Using a Microwave Resonant Cavity SystemDr. Aditya Nechiyil, ResCav LLC
Counterfeit and Clone Component Fingerprinting Using RAMAN and FTIR SpectroscopyJohn Kaminski, SMT
Session 4: Testing and Accreditation
SAE G19 and G21 Standards StatusWilliam Scofield, The Boeing Company and Dr. Diganta Das, University of Maryland
SAE Standard Laboratory Test Methods for Counterfeit Detection - 2025 StatusDr. Michael Azarian, University of Maryland
Test Laboratory Panel DiscussionModerator: Dr. Diganta Das, University of Maryland.
Panelists: Devon Richman, University of Maryland; Dan Tang, GETS; Roger Muse, ANAB; Nicholas William, SMT Corporation; Ken Turner, Hi-Rel Laboratories; and Michael Azarian, University of Maryland.
Wednesday, June 25
Session 5: Global View
Keynote Talk: A Global View Versus a U.S. Focus on OSAT Facilities Dr. Chuck Woychik, NHanced Semiconductors
Market Preference for Provenance and Traceability: US-EU InitiativeDr. Jeremy Muldavin, Cadence Design Systems
Session 6: Legal and Policy
Criminal Penalties for Trafficking in Counterfeit Microelectronics Prof. Patricia Campbell, University of Maryland Carey School of Law
Building Trust with TCG TechnologiesDr. Joshua Schiffman, HP Inc
Impacts of Blockchain on Supply Chain for Avoiding CounterfeitsDr. Diganta Das, University of Maryland
Session 7: Independent Distributor Voice
Panel Discussion on the State of the Industry: Survey Results by Anne PoncheriModerator: Anne Poncheri, InterCEPT.
Panelists: Mark Pollard, Astute Electronics Inc.; Scott McKee, 4 Star Electronics; Joe Rance, Abstract Electronics
You're Auditing Us Like a ManufacturerDane Reynolds, Astute Electronics Inc.
Session 8: Closing Session and Machine Learning Applications
Issues Related to Counterfeit Using Used / Aged PartsSultan Lilani, Integra
Visual Inspection in Counterfeit IC Detection Using AIDr. Chih-Yun Pai and Tom Zheng, Global ETS

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