Symposium on Counterfeit Parts and Materials 2024

June 25-27, 2024,
College Park, MD


Access to the presentations is limited to the symposium attendees and subscribers through SMTA. If you have attended the event or purchased proceedings access from SMTA, please request access here. CALCE Electronic Product and System Consortium Members have access to the proceedings using their CALCE member credentials.


Tuesday, June 25
Session 1: Opening Session Moderator: Diganta Das, Ph.D., University of Maryland
Symposium on Counterfeit Parts and Materials Diganta Das, Ph.D. (Program Chair) and Tanya Martin (Executive Director, SMTA)
Keynote Address 1: Securing Our Future - Combating Counterfeit Semiconductors with Trusted Manufacturing Demand Ezra Hall, GlobalFoundries
"The Numbers Crunch" Counterfeit Reporting Trends 2023 Richard Smith, ERAI
Break – Visit with Exhibitors and Sponsors  
Session 2: Broader View of the Supply Chain Moderator: Sultan Lilani, Integra Technologies
Managing Counterfeit Risk Through the Use of Trusted Suppliers David Chesebrough, Defined Business Solutions
Enhancing a Software Bill of Materials or Hardware Bill of Materials Leveraging Trusted Computing Standards and Principles Joshua Schiffman, HP Inc.
Market Preference for Provenance and Traceability tied to Critical Infrastructure: US-EU initiative Jeremy Muldavin, Aerocyonics
Lunch Break – Visit with Sponsors and Networking    
Session 3: Standards and Examples Moderator: Anne Poncheri, InterCEPT
Blockchain for Supply Chain Efficacy on Counterfeit Part Avoidance Hirbod Akhavantaheri, CALCE, University of Maryland
Status of SAE’s Counterfeit-Related Standards Jim Creiman, SAE G-19
Detection of Counterfeits Beyond Components - Examples and Challenges Diganta Das, Ph.D., CALCE, University of Maryland
Supplier Management for Purchases from Independent Distribution Anne Poncheri, InterCEPT
Break – Visit with Sponsors and Networking   
Session 4: Testing and Accreditation Moderator: Diganta Das, Ph.D., CALCE, University of Maryland
SAE Standard Laboratory Test Methods for Counterfeit Detection - 2024 Status Michael Azarian, Ph.D., CALCE, University of Maryland
Accreditation to ISO/IEC 17025 and AS6171: A General Overview Travis Johnson, ANAB
Test Laboratory Panel Discussion: AS6171 Adoption and Accreditation Moderator: Dr. Diganta Das (CALCE, University of Maryland)
Panelists will include Travis Johnson (ANAB), Dr. Michael Azarian (CALCE, University of Maryland), Anne Poncheri (InterCEPT), Sultan Lilani (Integra Technologies), and Dan Tang (Global ETS)
Adjourn  
Evening Reception  

 

Wednesday, June 26
Session 5: Law and Policy Moderator: Kevin Sink, TTI, Inc
Keynote Address 2: Microelectronics Acquisition Policy of the US Government Michael Fritze, Ph.D., Potomac Institute for Policy Studies
Debugging the Trademark Laws: Civil and Criminal Liability for Trafficking in Counterfeit Microelectronics Patricia E. Campbell, J.D., LL.M., Professor, University of Maryland Carey School of Law
Break – Visit with Sponsors and Networking  
Session 6: Aspects of Sources and Detection Moderator: Diganta Das, Ph.D., CALCE, University of Maryland
The Evolution of the Counterfeit Electronic Parts Threat Michael Schwarm and Jason Romano, SMT Corporation
Quality and Safety Issues of Counterfeit Lithium-Ion Batteries Masoud Rostami-Angas, Ansys
Side Channel Assessment of Components for Authenticity Evaluation and Beyond Devon Richman, CALCE, University of Maryland
Lunch Break – Visit with Sponsors and Networking   
Session 7: Machine Learning and AI Applications
 Moderator: Cameron Shearon, Raytheon Missiles & Defense
Evaluating Electronic Component Testing with AI-Based Test Augmentation Charlie Polidoro, PCX
Counterfeit IC Detection Using RF Excited Signals and AI-Assisted Classifications Jack Chuang, Ph.D. and David Griffith, Ph.D., NIST
Magnetic Current Imaging Using the Quantum Diamond Microscope David Glenn, EuQlid
Break – Visit with Sponsors and Networking  
Session 8: Closing Session
 Moderator: Diganta Das, Ph.D., University of Maryland
Back-to-Basic but Hard-to-Detect Visual Methodology to Identify Counterfeit Parts Krishna Ganason, Fusion Worldwide
Tackling Modern Day Obsolescence and Counterfeit Problem - An Update Sultan Lilani, Integra Technologies
Learnings from the event and path forward Members of the Technical Committee
Adjourn  

 

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