Symposium on Counterfeit Parts and Materials

Symposium on Counterfeit Parts and Materials

June 28-30, 2022,
College Park Marriott, Hyattsville, MD

The access to the presentations is limited to the conference attendees. If you have attended the event or purchased proceedings from SMTA, please request access here.

Tuesday, June 28
Session 1: Counterfeiting - the Current State of Play	Moderator: Dr. Diganta Das, Ph.D., University of Maryland
Opening Remarks	Dr. Diganta Das (Program Chair) and Tanya Martin (Executive Director, SMTA)
The Ascendance of Semiconductors	Michael Knight, President, Exponential Technology Group and Senior VP, Business Development, TTI
The 2021 Counterfeit Device Numbers Crunch	Mark Snider, President & Founder, ERAI Inc.
How the Shortage Market is Creating More Obsolescence and Counterfeit	Vernon Densler, Solutions Engineer, Sourceability North America LLC
Got to Buy a Thing from a Guy …	Prof. Peter Sandborn, University of Maryland
Session 2: Supply Chain Evolution	Moderator: Jerry Martinez, Part Specialist, Jet Propulsion Laboratory
Enterprise Network Models for Counterfeit Part Supply Chains	Hirbod Akhavantaheri, Ph.D. Student, University of Maryland
The Role of Authorized Supply Chain in Combatting Counterfeiting	David Loftus, President and CEO, Electronic Components Industry Association (ECIA)
Beyond Authorized Distribution: How to Vet Independent Distributors	Jerry Martinez, Part Specialist, Jet Propulsion Laboratory
Session 3: Secure and Trusted Ecosystem	Moderator: Tom Katsioulas, Board Chair, GSA TIES and Michael Ford, Sr. Director Emerging Industry Strategy, Aegis Software
Manufacturing Integrity and Authenticity Provenance	Jeremy Muldavin, Ph.D., GSA TIES and Distinguished Member of Technical Staff- Program Management, GlobalFoundries
Using a Virtual Identifier Thread for Traceability and Reliability	Dave Huntley, GSA TIES and Assembly Operations and Product Manager, PDF Solutions
Anchoring Your PCB Supply Chain Traceability with Roots of Trust	Tom Dodson, GSA TIES and Intel
Traceability: Security and Privacy Are Not Mutually Exclusive	Michael Ford, Sr. Director Emerging Industry Strategy, Aegis Software
Session 4: Track and Trace Point Solutions	Moderator: Cameron Shearon, Principal Engineer, Raytheon Missiles & Defense
A Proficiency Scheme for Counterfeit Part Testing Effectiveness	Stephen Foster, Branch Chief DMSMS, HAZMIN, and GEM Program, DLA Land and Maritime Steve Walters, Chief Engineer - Reliability, Systems and Test, Aerocyonics, Inc.
Laser Focused Traceability of Microelectronics in the Supply Chain	Steve Walters, Chief Engineer - Reliability, Systems and Test, Aerocyonics, Inc.
Embedded Digital RFID for Chip Asset Tracking	Aydin Aisu, North Carolina State University

Wednesday, June 29
Introductory Invited Presentation Tracing Key Components Used in Russian Weapons Used	Damien Spleeters, Deputy Director of Operations, Conflict Armament Research
Session 5: Counterfeit Detection Tools and Methods	Moderator: John Radman, Director of Program Management, NTS
Testing Method to Identify Counterfeit Field-Programmable Gate Arrays (FPGAs)	Stephen Saddow, Global ETS and Professor, University of South Florida
Comparison of Side Channel, Machine Vision, and Standards-Based Counterfeit Detection Methods	Devon Richman, Ph.D. Student, CALCE, University of Maryland
Session 6: Standards to Support Counterfeit Avoidance	Moderator: Anne Poncheri, Director of Quality Assurance, Resion
Safe Handling and Removal Procedures of EEE (ESD Sensitive) Parts from IC Packaging	Robert Vermillion, CEO and Founder, RMV Technology Group LLC
The IPC Cybersecurity Standard	Watanabe Hiroyuki, Executive Director Global Security, NEC
SAE AS7124™ Industry Practice for the Government Industry Data Exchange Program (GIDEP)	Eric Murphy, Regulatory Compliance Manager, Boeing
Session 7: Standards (Continued)	Moderator: Kevin Sink, VP of Quality, TTI
SAE G-19 Standards - A Review of Status	Dr. Diganta Das, CALCE, University of Maryland
SAE 6171 Standards - Getting the Best from Your Testing	Dr. Michael Azarian, CALCE, University of Maryland
Understanding How ISO/IEC 17025 is Needed for AS6171	Anne Poncheri, Director of Quality Assurance, Resion
Session 8: Detection Methods	Moderator: Dr. Diganta Das, Ph.D., University of Maryland
Printed Wiring Assemblies (PWA) and Counterfeit Detection using Non-Destructive X-ray CT Analysis	Christopher P. Walker, Principle Member of Technical Staff, Sandia National Labs
AI Visual Detection of Defects and Corrosion on Leads in Electronic Components	Zeev Efrat, CEO, Cybord
Closing Panel Discussion - Lessons Learned	Members of the Technical Committee

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