| Tuesday, August 3 |
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Session 1: Counterfeit Statistics and Direction
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Moderator: Diganta Das, Ph.D., University of Maryland |
| Opening Remarks |
Diganta Das, Ph.D., and Tanya Martin, Executive Direcor, SMTA |
| Invited Opening Talk: Modern, Complex Cloned Devices: How Do They Compare to Authentic Components and Traditional Counterfeits? |
Nicholas Williams, Ph.D., SMT Corp |
| Trends in Counterfeit Electronics - a Data-Driven Analysis |
Fred Schipp, Ph.D., NSWC Crane |
| Industry Standards to Mitigate Counterfeit Risk in the Supply Chain |
Jim Creiman, Northrup Grumman |
| Session 2: Supply Chain Evolution |
Moderator: Kevin Sink, TTI, Inc. |
| Enterprise Network Models for Counterfeit Part Supply Chains |
Hirbod Akhavantaheri (with Dr. Diganta Das and Prof. Peter Sandborn), University of Maryland
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| Enhance Supply Chain Security and Technology Development Practices Through O-TTPS / ISO 20243 Certification |
Christine Bunke (with Marie Cole), IBM Corporation
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| Avoiding Fraud and Identity Theft While Sourcing Hard-to-Find Parts During a Global Chip Shortage |
Richard Smith, ERAI |
| The Impact of Obsolescence and Shortages on Counterfeit Risk |
Vernon Densler, Sourceability |
| Session 3: Side Channel based Detection |
Moderator: Diganta Das, Ph.D., University of Maryland |
| Comparative Assessment of Side Channel, Machine Vision, and Standards-Based Methods for Counterfeit Detection and Prevention |
Michael H. Azarian, Ph.D. (with Diganta Das, Ph.D., and Devon Richman), University of Maryland |
| Evaluating the Effectiveness of Second Order Effect (2OE) Methods to Mitigate Specific Supply Chain Risks |
Brendan Foran, Ph.D., The Aerospace Corporation |
| Electronic Component Authenticity via Electrical Signal Measurement and Artificial Intelligence with Deep Learning |
Junjie Xiong, University of South Florida |
| Session 4: Tracking and Machine Vision |
Moderator: Bill Cardoso, Ph. D., Creative Electron Inc. |
| Method to Mitigate Electronic Component Shortages and Validate Secondary Market Unauthorized Components |
Eyal Weiss, Ph.D., Cybord (with Tovi Yadin, Siemens) |
| Machine Learning and Machine Vision Systems for Microelectronic Screening |
Naresh Menon, Ph.D., Covisus |
| Supply Chain Traceability: Identifying and Eliminating Counterfeit Parts |
Matt Bellis, SAVTEQ (Seikowave Advanced Visual Technology) |
