Counterfeit Electronics and Materials Symposium 2025

April 15-16, 2025,
London, England


Access to the presentations is limited to the symposium attendees and subscribers through SMTA. If you have attended the event or purchased proceedings access from SMTA, please request access here. CALCE Electronic Product and System Consortium Members have access to the proceedings using their CALCE member credentials.


Tuesday, April 15
Session 1: Cause and Effect Moderator: Diganta Das

Introduction to the Organizers and the Event

 Diganta Das, Ian Blackman, and Roger Rogowski
Keynote Talk: The Intersection of Obsolescence and Counterfeiting Daniel Grundy, Jaguar Land Rover
2024 Numbers Crunch Richard Smith, ERAI, Inc
Session 2: Risks to the System Moderator: Giovanna Mura
Industry Talks  
License to Bridge the Gap: The Semiconductor Vs Program Lifecycle Delta Luke Fitzpatrick, Rochester Electronics
Reporting and Sharing Information on Counterfeit Cases Roger Rogowski and Ian Blackman, Anticounterfeiting Forum
Secure Electronics Manufacturing for Counterfeit Detection and Tampering Prevention Sean Bouskila and Eyal Weiss, Cybord

 

Wednesday, April 16
Session 3: Policies and Implications Moderator: Roger Rogowski
Keynote Talk: Intellectual Property Laws in the UK and their Enforcement Strategies Miles Rees, Deputy Director, Enforcement Intellectual Property Office
Sustainable and Strategic Design to Combat Component Unavailability Rob Picken, Sourceability 
Session 4: Market Status and European Standards Moderator: Ian Blackman
Update on International Counterfeit Standards Jo Vann, GE Aviation
Securing Supply Chains and Advancing Sustainability: A Comprehensive Look at Retronix Component Preparation Services Rob Ronan, Retronix
Counterfeit and Clone Component Fingerprinting Using RAMAN and FTIR Spectroscopy Nick Williams, SMT Corp.
Session 5: Workshop  
Use of Component Documentation for Counterfeit Detection Diganta Das, CALCE, University of Maryland
Session 6: SAE Standards Moderator: Stuart Saunders
An Overview of the SAE Standards Related to Counterfeit Diganta Das, CALCE, University of Maryland
Accreditation to ISO/IEC 17025 and AS6171: A General Overview Travis Johnson, ANAB
Session 7: Technical Topics Moderator: Diganta Das
Geo-Political Impacts on Counterfeit Risk Ian Blackman, Anticounterfeiting Forum
Closing Panel Discussion - Lessons Learned Committee Members

 

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