Long-Term Non-Operating Reliability of Electronic Products
Created: 8/15/95 Updated: 2/5/98
Long-Term Non-Operating Reliability of Electronic Products
edited by J. Pecht, M. Pecht
CRC Press, New York, NY, 1995

This book examines non-operating electronics reliability issues, outlining and discussing storage conditions, and the failure mechanisms that can cause a failure. Storage is the state in which the system is totally inactive and resides in a storage area. Often it is necessary for a stored device to be unpacked and connected in order for it to be tested. Other non-operating conditions include dormancy -- the state in which the system is in its normal operational configuration and may be electrically connected but is not operating.
Although innumerable books and technical papers discuss the reliability of electronic components under operational conditions, there is a lack of information on electronics reliability under non-operating conditions. In general, electronics are developed and manufactured not to fail under operating conditions, such as current, voltage, and generated temperature. However, electronics are also subject to non-operating conditions (dormancy and storage), in which stresses such as humidity, ionic containments, temperature, radiation, shock, and vibration can occur over extended periods of time.
The need for high non-operating reliability of electronics is especially critical in lifesaving devices, such as air bags in automobiles, fire alarm systems, standby power sources, burglar alarm systems, earthquake warning systems, and radiation warning systems in nuclear power plants, which may lie dormant for a long time before being activated. Among defense applications, high non-operating reliability is important in missiles and munitions systems electronics, which often lie dormant for years before being deployed on very short notice.

Catalog no. 9621 PCA
June 1995, 144 pp., ISBN: 0-8493-9621-2
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