Reliability of Gallium Arsenide Monolithic Microwave Integrated Circuits
Created: 5/21/95 Updated: 2/5/98
Reliability of Gallium Arsenide Monolithic Microwave Integrated Circuits
edited by A. Christou
John Wiley & Sons, New York, NY, 1992

This book familiarizes the designer with issues related to GaAs device reliability and enables designers to develop the required reliability prediction tools. Covering both the electrical and mechanical reliabi lity of MMICs, this book focuses upon the physical, chemical and electrical mech anisms which cause circuit drift, inaccuracies and degradation of circuit functi on. From the chip to circuit interconnection and packaging, this text presents a comprehensive analysis of the reliability and quality of MMICs. The book builds on research for government and industry being conducted at CALCE EPRC. Key chapters on electromigration, reliability of MMIC metallizations, and radiation effects have also been written by internationally recognized experts from Europe and the United States. The University of Maryland is unique in its effort to focus on reliability and quality issues in every system design, centering on an understanding of basic device failure mechanisms. The book therefore focuses on a physics-of-failure approach to understanding MMIC reliability, covering basic failure modes for each of the device building blocks up to packaged MMIC modules. The book is the recommended text for a graduate course in Mechanical Engineering at the University of Maryland titled "Manufacturing Technology of Microcircuits."

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