Electromigration and Electronic Device Degradation
Created: 5/21/95 Updated: 2/5/98
Electromigration and Electronic Device Degradation
edited by A. Christou
John Wiley & Sons, New York, NY, 1993

This book addresses electromigration failure modes in electronics covering both theory and experiments. It reviews both silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. The book concludes with a discussion of the current status and future plans for electromigration resistant advanced metallization systems for VLSI.

ISBN: 0-471-58489-4
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