Devon R. Richman1, Connor P. Dempsey2, Steven J. Dourmaskin2, Michael H. Azarian1 and Diganta Das1
1Center for Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, MD, United States
2Chiplytics, Seattle, U.S.
For more information about this article and related research, please contact Dr. Michael Azarian.
Abstract:
This study provides a comparative evaluation of the effectiveness of side-channel power spectrum analysis (PSA) for counterfeit microelectronic component detection using the Chiplytics PSA system and benchtop test and measurement equipment. Independent testing was performed by the University of Maryland's CALCE laboratory and Chiplytics using three signal voltage levels applied to three sets of functionally identical logic gate parts. Data was analyzed using principal component analysis and K-means clustering. The K-means fit was assessed based on the clustering accuracy and the silhouette score. The Chiplytics PSA system consistently achieved higher clustering accuracy than the benchtop equipment, with Chiplytics achieving 100% accuracy for all tested voltages. Similarly, the Chiplytics PSA system consistently demonstrated a silhouette score > 0.6 independent of test site, compared to the benchtop equipment, which only achieved a silhouette score > 0.6 for a single measurement setup across the two test sites. The benchtop equipment yielded inconsistent results across teams, underscoring the impact of setup variability. The results indicate that a standalone PSA measurement system provides improved counterfeit detection capabilities over traditional benchtop equipment configurations.
This article is available online here and to CALCE Consortium Members for personal review.