Aniket Bharamgonga 1*, Dr. Abhijit Dasgupta 1, Dr. Abhishek Deshpande 1, Torsten Hauck 2, and Yaxiong Chen 2
1 Center for Advanced Life Cycle Engineering, University of Maryland, College Park, USA.
2 NXP Semiconductors
For more information about this article and related research, please contact Prof. Abhijit Dasgupta.
Abstract:
SAC solder joints contain a few large grains and are
hence termed oligocrystalline. Solder joints represent
heterogeneous anisotropic behavior which affect durability
of solder joint during thermal and mechanical loading
conditions. In this paper, variability in durabiity of solder
joints under cyclic mechanical bending of CSP assemblies
was studied. A global 3D slice model of CSP package was
used anddisplacement were transferred to a more detailed
local model of the critical solder joint, using a submodeling
approach. Further simulations were conducted on this
critical CSP joint. Local model results were compared with
global model.
This article is available online here and to CALCE Consortium Members for personal review.