Andre Kleynera, Arvind Vasanb, and Michael Pecht c
a Delphi Electronics and Safety, Kokomo, IN 46902
b Empower Micro Systems Inc., Santa Clara, CA 95054
c CALCE, Center for Advanced Life Cycle Engineering, Department of Mechanical Engineering, University of Maryland, College Park, Maryland 20742, USA
Abstract:
This paper presents a novel application of failure prognosis
to shorten the time of reliability testing. Typically,
prognostic outcome is used to make real time health
management decisions such as modify mission plan, change
system operation parameters to reduce stress and increase
remaining useful life, and more. In this work we
demonstrate the use of prognostics to reduce the duration of
lengthy and expensive tests, such as power temperature
cycling and high temperature endurance in the automotive
electronics validation process.