Microelectronics Reliability 55, pp 1054-1059, April 2015, DOI:10.1016/j.microrel.2015.04.001

Anomaly detection for IGBTs using Mahalanobis distance

Nishad Patil, Diganta Das, Michael Pecht

Center for Advanced Life Cycle Engineering (CALCE)
University of Maryland, College Park, MD 20742, United States


In this study, a Mahalanobis distance (MD)-based anomaly detection approach has been evaluated for non-punch through (NPT) and trench field stop (FS) insulated gate bipolar transistors (IGBTs). The IGBTs were subjected to electrical–thermal stress under a resistive load until their failure. Monitored on-state collector–emitter voltage and collector–emitter currents were used as input parameters to calculate MD. The MD values obtained from the healthy data were transformed using a Box–Cox transform, and three standard deviation limits were obtained from the transformed data. The upper three standard deviation limits of the transformed MD healthy data were used as a threshold for anomaly detection. The anomaly detection times obtained by using the MD approach were compared to the detection times obtained by using a fixed percentage change threshold for the on-state collector–emitter voltage.

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