Microelectronics Reliability, Volume 53, Issue 12, December 2013, Pages 2052-2056, ISSN 0026-2714, http://dx.doi.org/10.1016/j.microrel.2013.06.016

Long term storage reliability of anti-fuse field programmable gate arrays

Nishad Patil, Diganta Das, Estelle Scanff, Michael Pecht *
Center for Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, MD 20740, USA


Field Programmable Gate Arrays (FPGA) with anti-fuse elements are preferred in aerospace applications due to their non-volatility and demonstrated radiation hardness. Because aerospace applications typically involve long operating life, there is a requirement to store un-programmed anti-fuse FPGA parts for long periods and program them when necessary to support the system. No study on the long term reliability of un-programmed anti-fuse FPGAs in the storage environment is reported in literature. In this paper, anti-fuse structures, programming process, and failure mechanisms of anti-fuse FPGAs are discussed. A failure modes, mechanisms and effects (FMMEA) analysis was performed for storage conditions and critical failure mechanisms were identified. High temperature storage tests of a select number of anti-fuse FPGAs were performed to accelerate the identified failure mechanisms. These parts were subsequently programmed and yield data was analysed to determine the effects of high temperature storage

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