Mohammed A. Alam 1, Michael H. Azarian1, and Michael G. Pecht 1
1Center for Advanced Life Cycle Engineering, Department of Mechanical Engineering, University of Maryland, College Park, Maryland 20740, USA
Highly accelerated life testing (HALT) was
performed on embedded planar capacitors by subjecting these
devices to elevated temperature and voltage aging conditions.
The dielectric material of these capacitors was a nanocomposite
of epoxy and BaTiO3. The objective of HALT was to model
the time-to-failure as a function of temperature and voltage
using the Prokopowicz model. This involved computing the
constants of the Prokopowicz model, voltage exponent (n),
and activation energy (Ea) for a nanocomposite of epoxy and
BaTiO3. The results of HALT can be used for the qualification of
embedded planar capacitors and for further improvement in the
material and the manufacturing processes of these capacitors.