IMAPS Advanced Technology Workshop on High Reliability Microelectronics for Military Applications, Linthicum Heights, MD, May 17-19, 2011

Likelihood of Metal Vapor Arc by Tin Whiskers

Sungwon Han, Michael Osterman, Michael Pecht
Center for Advanced Life Cycle Engineering (CALCE),
University of Maryland, College Park, Maryland, 20740, USA

Abstract:

- For electronic equipment, tin whisker growth presents a reliability concern due to the potential to create unintended electrical shorts. Under certain conditions, tin whiskers can initiate a metal vapor arc that can have destructive consequences. This study investigates the role of the bias voltage, pressure, and whisker geometries on the metal vapor arc formation and a metric for whisker arc formation is proposed.

Keywords: Tin whisker, metal vapor arc, electrical short

Complete article is available from publisher and to CALCE Consortium Members.



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