Sungwon Han, Michael Osterman, Michael Pecht
Center for Advanced Life Cycle Engineering (CALCE),
University of Maryland, College Park, Maryland, 20740, USA
- For electronic equipment, tin whisker growth presents a reliability concern due to the potential to create unintended electrical shorts. Under certain conditions, tin whiskers can initiate a metal vapor arc that can have destructive consequences. This study investigates the role of the bias voltage, pressure, and whisker geometries on the metal vapor arc formation and a metric for whisker arc formation is proposed.
Keywords: Tin whisker, metal vapor arc, electrical short
Complete article is available from publisher and to CALCE Consortium Members.