IMAPS Advanced Technology Workshop on High Reliability Microelectronics for Military Applications, Linthicum Heights, MD, May 17-19, 2011

Likelihood of Metal Vapor Arc by Tin Whiskers

Sungwon Han, Michael Osterman, Michael Pecht
Center for Advanced Life Cycle Engineering (CALCE),
University of Maryland, College Park, Maryland, 20740, USA


- For electronic equipment, tin whisker growth presents a reliability concern due to the potential to create unintended electrical shorts. Under certain conditions, tin whiskers can initiate a metal vapor arc that can have destructive consequences. This study investigates the role of the bias voltage, pressure, and whisker geometries on the metal vapor arc formation and a metric for whisker arc formation is proposed.

Keywords: Tin whisker, metal vapor arc, electrical short

Complete article is available from publisher and to CALCE Consortium Members.

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