Microelectronics Reliability, Vol. 51, Issue 2, pp. 279-284, Feb 2011

Health Monitoring of Electronic Products Based on Mahalanobis Distance and Weibull Decision Metrics

Gang Niu a, Satnam Singh b, Steven W. Holland c, Michael Pecht a,d

aCenter for Prognostics and System Health Management, City University of Hong Kong, 83 Tat Chee Avenue, Kowloon, Hong Kong
bDiagnosis and Prognosis Group, GM India Science Lab, GM Global R&D, Bangalore, India
cElectrical & Controls Integration Lab, GM Global R&D, Warren, MI 49090, USA
dCenter for Advanced Life Cycle Engineering (CALCE), University of Maryland, College Park, MD 20742, USA


This paper presents a novel approach for health monitoring of electronic products using the Mahalanobis distance (MD) and Weibull distribution. The MD value is used as a health index, which has the advantage of both summarizing the multivariate operating parameters and reducing the data set into a fused distance index. The Weibull distribution is used to determine health decision metrics, which are useful in characterizing distributions of MD values. Furthermore, a case study of notebook computer health monitoring system is carried out. The experimental results show that the proposed method is valuable.

Complete article is available from publisher and to the CALCE consortium members.

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