Mohammed A. Alam, Michael H. Azarian, Michael Osterman and Michael Pecht
Center for Advanced Life Cycle Engineering (CALCE)
1103 Engineering Lab Building
University of Maryland, College Park, MD 20742
The leakage current mechanism in an epoxy-BaTiO3 composite dielectric used in embedded capacitors is investigated in this paper. The thickness of the dielectric was 8 μm and BaTiO3 particles were loaded 45% by volume in the epoxy matrix. Leakage current was measured across the embedded capacitor dielectric over a range of voltages from 0 to 100 V. These measurements were performed over temperatures ranging from 298 K to 398 K. It was found that the mechanism of the leakage current changed at a temperature close to 338 K. Various conduction models such as Schottky, Poole-Frenkel, and ionic hopping were evaluated by comparing the functional dependence of leakage current on voltage and temperature. It was found that the observed conduction behaviour is most consistent with the hopping mechanism.
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