SAMSUNG Electronics Co., Ltd.
Gwangsan-Gu Gwangju-City 506-723, South Korea
Dennis L. O’Neal
Texas A&M University
College Station, TX, USA
City University of Hong Kong
CALCE Electronic Products and Systems Research Center
University of Maryland
College Park, MD 20742
Based on field data and a tailored set of accelerated life tests, the hinge kit system of a closing door in a Kimchi refrigerator was redesigned. Using a force and moment balance analysis, the simple mechanical loads from the closing of the door were evaluated. The failure modes and mechanisms found experimentally were similar to those of the failed sample in the field. Failure analysis, accelerated life tests and corrective action plans were used to identify the key control parameters and level for the mechanical hinge kit system. The missing controllable design parameters of the hinge kit system in the design phase included the corner rounding and rib of the housing hinge kit, the oil sealing method of the oil damper, and the material of the cover housing. After a tailored series of accelerated life tests with corrective action plans, the B1 life of the new hinge kit design is now guaranteed to be over 10 years with a yearly failure rate of 0.1%.
Index Terms: Robustness, Parameter design, Load analysis, Accelerated life testing
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