IEEE Transactions on Device and Materials Reliability, Vol. 9, Issue 1, pp. 80-86, March 2009

Assessing the Reliability of Elastomer Sockets in Temperature Environments

Leoncio D. Lopez
Vidyu Challa
Michael G. Pecht, Fellow, IEEE
Center for Advanced Life Cycle Engineering (CALCE)
Electronic Products and Systems Center
Department of Mechanical Engineering
University of Maryland
College Park, MD 20742

This paper presents a study on the contact resistance behaviour of elastomer sockets used to interconnect microprocessors and printed circuit boards in enterprise servers. The integrated circuit sockets, installed in production representative assemblies, were evaluated at 25 ◦C, 55 ◦C, and 75 ◦C for 2000 h. A sample subset was evaluated up to 16 500 h at 25 ◦C and up to 4500 h at 55 ◦C. The test results show that contact resistance decreases over time for all test conditions, as much as 50% from their initial values. Elastomer contact behaviour is strongly dependent on temperature and time. The resistance behaviour over temperature is modeled with multiple statistical distributions. The mean contact resistance is represented with a physics-of-failure model, and the elastomer contact reliability is estimated using a log-normal distribution.

Index Terms: Accelerated testing, contact resistance, elastomer socket, physics of failure (PoF).

Complete article is available to CALCE Consortium Members.

© IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

[Home Page] [Articles Page]
Copyright © 2009 by CALCE and the University of Maryland, All Rights Reserved