IEEE Trans. on Advanced Packaging, Vol. 31, No. 1, pp. 76-81, February 2008.

A Random Trimming Approach for Obtaining
High-Precision Embedded Resistors

Phillip Sandborn and Peter A. Sandborn, Senior Member, IEEE
CALCE Electronic Products and Systems Center
University of Maryland, College Park, MD 20742, USA


Embedded resistors will potentially allow electronic applications to cost less and perform better. However, it is difficult to fabricate embedded resistors to the correct resistance value, so embedded resistors are often fabricated with a lower value and then trimmed to raise the resistance to the desired value. A computer simulation for the trimming process of an embedded resistor has been developed that has been verified and calibrated against experimental results. A study of embedded resistors containing random voids of varying size has been performed. A new trimming strategy in which the trims are made randomly (rather than conventional L-shaped trims) is proposed and the results of the analysis demonstrate that single-dive trimming combined with random trimming allows higher precision embedded resistors to be obtained than conventional trimming patterns.

Keywords: Embedded passives, embedded resistors, numerical simulation, random trimming, trimming, voids.

Complete article is available to CALCE Consortium Members.

© IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

[Home Page] [Articles Page]
Copyright © 2008 by CALCE and the University of Maryland, All Rights Reserved