AAAI Fall Symposium on Artificial Intelligence for Prognostics, pp. 26-32, Arlington, VA, Nov, 2007
S. Cheng and M. Pecht
University of Maryland
College Park, MD 20742
This paper investigates the use of Multivariate State Estimation Techniques as input in predicting the remaining useful life prediction of electronic products. A prognostics approach combining the Multivariate State Estimation Technique with life cycle damage prediction is then presented, along with a case study. The challenges of the approach are also discussed.
Complete article is available to CALCE Consortium Members.