Journal of the IEST, Vol. 50, No. 1, pp 86-97, April 2007.

Virtual Remaining Life Assessment of Electronic Hardware Subjected to Shock and Random Vibration Life Cycle Loads

S. Mathew, D. Das, M. Osterman, and M. Pecht
University of Maryland
College Park, MD 20742

Robin Ferebee
NASA Marshall Space Flight Center
Huntsville, AL 35802

Joe Clayton
BD Systems Inc.
Huntsville, AL 35802


This paper describes a physics of failure based virtual remaining life assessment method for assessing the remaining life of an electronic circuit card. The approach is then demonstrated through a case study of a circuit card assembly of the space shuttle solid rocket booster. Using thermal and mechanical stress damage models the accumulated damage in the circuit card due to its life cycle environment loads was calculated. Based on the amount of damage accumulated, the remaining life of the circuit card was estimated.

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