Abstract:

This paper presents a probabilistic-approach-based reliability prediction model of semiconductor light emitting devices. Using this model with given initial light-emitting performance and degradation behavior otherwise determined by experiment1, the reliability function of the devices is obtained, and the results well correlates with experimental results. This study is a step to develop a complete physics-of-failure-based reliability prediction methodology for semiconductor light emitting devices. It provides an approach and proves the feasibility of determining a reliability function based on fundamental parameters of device performance.

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