IEEE Transactions on Device and Materials Reliability, Vol. 3, No. 4, pp. 218-222, December 2003

Reliability Prediction Modeling of Semiconductor Light Emitting Device

Jingsong Xie and Michael Pecht
CALCE Electronic Products and Systems Center
University of Maryland
College Park, MD 20742


This paper presents a probabilistic-approach-based reliability prediction model of semiconductor light emitting devices. Using this model with given initial light-emitting performance and degradation behavior otherwise determined by experiment1, the reliability function of the devices is obtained, and the results well correlates with experimental results. This study is a step to develop a complete physics-of-failure-based reliability prediction methodology for semiconductor light emitting devices. It provides an approach and proves the feasibility of determining a reliability function based on fundamental parameters of device performance.

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