Proceedings of the International Test Conference, October 2003

Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in
Electronic Systems Assembly Using Real-Coded Genetic Algorithms

Zhen Shi and Peter Sandborn

CALCE Electronic Products and Systems Center
University of Maryland
College Park, MD 20742


This paper presents a framework for optimizing the location(s) and characteristics (fault coverage/test cost, rework success rate/rework cost) of Test / Diagnosis / Rework (TDR) operations in the assembly process for electronic systems. A new search algorithm called Waiting Sequence Search (WSS) is applied to traverse a general process flow in order to perform the cumulative calculation of a yielded cost objective function. Real-Coded Genetic Algorithms (RCGAs) are used to perform a multi-variable optimization that minimizes yielded cost. Several simple cases are analyzed for validation and a general complex process flow is used to demonstrate the applicability of the algorithm.

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