2002 Proceedings of the 48th ATM, ISBN: 1-877862-81-9, Document No. 2011, Published on April 1, 2002

Simulation Improved Testing of Electronic Hardware

Michael Osterman and Abhijit Dasgupta
University of Maryland
College Park, MD 20742

L. Tonnelier
Suresnes Cedex, France


Simulation guided testing is introduced as a process for evaluating the life expectancy of electronic hardware and for developing and assessing the effectiveness of physical tests. An avionic circuit card assembly is examined as a demonstration vehicle for the process. Simulation techniques are used to assess effectiveness of physical tests on the avionic circuit card assembly. The impact of component and material substitutions are examined. The process is shown to provide the ability to relate physical tests to anticipated field conditions. The time frame required to conduct a test to failure and to identify the life limiting features of the circuit card assembly is determined.

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