Microelectronics Reliability, Vol. 42, No. 8, pp. 1155-1162, August, 2002

A Review of Reliability Prediction Methods for Electronic Devices

B. Foucher and J Boullie,
EADS CCR, 12, rue Pasteur BP76
92152 Suresnes Cedex, France

B. Meslet and D. Das
University of Maryland
College Park, MD 20742


A wide range of reliability prediction methods is available today for electronic systems. This article classifies the commonly used and referred to reliability prediction methodologies into some categories easy to understand. A set of selected methods, which are of relevance to many industries, the aerospace industry among others, are reviewed and the possibility they offer to address the stated objectives is assessed. Their respective advantages and shortcomings are the basis for the recommendation we make to use the methods in a combined fashion (simultaneously or successively) along the product development process.

Complete article is available to CALCE Consortium Members


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