IEEE Transactions on Aerospace and Electronic Systems, Vol. 37, No. 1, pp. 266-272, January 2001

Evaluation of 'Built-in Test'

Michael Pecht, M. Dube and M. Natishan
CALCE - Electronic Products and Systems Center
University of Maryland
College Park, MD 20742

R. Williams, J. Banner and I. Knowles
Defense Procurement Agency
Abbey Wood,
Bristol BS34 8JH UK


Built-in test provides fault finding as a means to aid in system assembly, test and maintenance. This paper describes an investigation to evaluate built-in test of a particular electronics board used in the in-flight entertainment system for Boeing 777s. We found built-in test proved useful when failure occurrences were uniquely associated with the operating environment; situations which can result in no-fault found, or could-not duplicate failures upon test. We also observed cases where the built-in test failed to observe failures, and in some cases pointed to the wrong cause of failure. These and other advantages and disadvantages of BIT implementation are discussed.

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