Microelectronics Reliability, Vol. 41, No. 12, pp. 2067-2070, December 2001

Process Capability and Product Reliability

Bharatwaj Ramakrishnan
Advanced Micro Devices
3625 Peterson Way
Santa Clara, CA 95954

Peter Sandborn and Michael Pecht
University of Maryland
College Park, MD 20742


This paper discusses process capability indices - Cp & Cpk, their underlying assumptions, and the relationships between process capability indices and process yield. An actual case is presented to demonstrate the issues.

Complete article is available to CALCE Consortium Members


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