Jingsong Xie and Michael Pecht
CALCE Electronic Products and Systems Consortium
University of Maryland
College Park, MD 20742
Sudip Das, Joe Nuebel, and Bahram Zand
Sun Microsystems Inc.,
Palo Alto, CA 94303
A typical enclosure for information technology (IT) equipment is made of various sub-assemblies such as enclosure cases, gaskets and I/O connectors, and the shielding effectiveness of the enclosure is largely determined by junctions in the enclosure for electrically connecting different shielding panels or components. Inter- metallic junctions may get corroded and the shielding effectiveness of the enclosure may deteriorate. The identification of the corrosion mechanisms responsible for the shielding degradation of zinc-coated steel enclosures is the primary focus of this study. A series of preliminary experimental investigations were conducted to help in identifying the corrosion mechanisms. Factors contributing to the corrosion process are discussed. This work provides a basis for on-going effort in experimentally quantifying and modeling the corrosion and corrosion-induced shielding-degradation behavior of electromagnetic shielding enclosures.
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