Semiconductor International, pp. 101-106, Sept. 1999.

Trends in Component Reliability and Testing

Yibin Zhang, Diganta Das, Asaf Katz and Michael Pecht
CALCE Electronics Products and Systems Center,
University of Maryland
College Park, MD

Örjan Halberg
Ericsson Telecom AB,
Stockholm, Sweden


Time-to-failure of semiconductor components has doubled every 15 months since 1973, leading to a notable increase in effective activation energy. This suggests it is no longer justifiable to regard activation energy as a stable physical constant. Recent data also show the acceleration factor used for test-to field analysis is doubling every five years. Taking these trends into account in testing strategies will improve reliability while reducing accelerated life testing times and expense.

Complete article is available to CALCE Consortium Members.

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