Microelectronics Reliability, Vol. 38, pp. 1829-1834

Low Temperature Delamination of Plastic Encapsulated Microcircuits

P. McCluskey, F. Lilie and O. Beysser
CALCE Electronic Products and Systems Consortium
University of Maryland, College Park, MD 20742

A. Gallo
Dester Electronic Materials, Olean, NY


Plastic encapsulated microcircuit (PEMs) are increasingly being used in applications requiring operation at temperature lower than the manufacturer's recommended minimum temperature which is 0C for commercial grade components and -40C for industrial and automotive grade components. To characterize the susceptibility of PEMs to delamination at these extreme low temperatures, packages with different geometries, encapsulated in both biphenyl and novolac molding compounds, were subjected to up to 500 thermal cycles with minimum temperatures in the range -40 to -65 in both the moisture saturated and baked conditions. Scanning acoustic microscopy revealed there was a negligible increase in delamination at the die-to-encapsulant interface after thermal cycling for the 84 lead PQFPs encapsulated in novolac and for both 84 lead PQFPs and 14 lead PDIPs encapsulated in biphenyl molding compound. Only the 14 lead novolac PDIPs exhibited increased delamination. Moisture exposure had a significant effect on the creation of additional delamination.

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