Proceedings of 1995 Advanced Technology, Acquisition, Qualification, and Reliability,
Newport Beach, CA, pp. 269-278, August 1995.

Long Term Storage Reliability for Plastic Encapsulated Microcircuits

A. Fowler, P. McCluskey, and K. Rogers


Characterize degradation in long term storage.  Identify failure modes, sites, and mechanisms.  Use physics-of-failure based reliability assessment tools to develop acceleration transforms.  Employ accelerated test methods.  Relate observed degradation to test results.  Assess future storage and operational reliability.  Implement findings in software.

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