Proceedings of 1995 Advanced Technology, Acquisition, Qualification, and Reliability,
Newport Beach, CA, pp. 269-278, August 1995.

Long Term Storage Reliability for Plastic Encapsulated Microcircuits

A. Fowler, P. McCluskey, and K. Rogers


Abstract:

Characterize degradation in long term storage.  Identify failure modes, sites, and mechanisms.  Use physics-of-failure based reliability assessment tools to develop acceleration transforms.  Employ accelerated test methods.  Relate observed degradation to test results.  Assess future storage and operational reliability.  Implement findings in software.




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