Long Term Storage Reliability for Plastic Encapsulated Microcircuits
A. Fowler, P. McCluskey, and K. Rogers
Characterize degradation in long term storage. Identify failure modes, sites, and mechanisms. Use physics-of-failure based reliability assessment tools to develop acceleration transforms. Employ accelerated test methods. Relate observed degradation to test results. Assess future storage and operational reliability. Implement findings in software.