IEEE Transactions on Reliability, Vol. 43, No. 1, March 1994.

Failure Mechanism Models for Material Aging Due to Inter-Diffusion

J. Li and A. Dasgupta


Abstract:

This tutorial illustrates design situations where material aging due to inter diffusion in some components can compromise system performance over time, thereby acting as a wearout failure mechanism.  Micro-structural diffusion mechanisms, continuum diffusion models, and inter-diffusion analysis techniques are presented to design against such failures.  An example illustrates the application of the mechanisms, models, and techniques in electronic packaging.
 

Complete article is available to CALCE Consortium Members.

© IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.



[Home Page] [Articles Page]