Modeling the Effects of Mixed Flowing Gas (MFG) Corrosion and Stress Relaxation on Contact Interface Resistance
S. Bhagath and M. Pecht
This paper presents the development of an initial, "first-cut", mathematical
model for the prediction of electrical interface reliability trends.
The model pertains to gold plated contacts subject to loss of normal force
and environmental corrosion with time. Stress relaxation over time
and temperature in the base metal of the contact is accounted for.
Utilizing the results of Mixed Flowing Gas (MFG) tests, the model can be
used to estimate the statistical contact resistance at a particular load
(normal force), aging and operating temperature in the class II and III
environments. An attempt is made to correlate experimental data with
the classical Holm's equation and to introduce time dependence into the
equation. Further work is proposed to correlate results with experimental
connector performance data.
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