Role of Failure-Mechanism Identification in Accelerated Testing
J. Hu, D. Barker, A. Dasgupta, and A. Arora
Accelerated life testing techniques provide a short-cut method to investigate
the reliability of electronic devices with respect to certain dominant
failure mechanisms that occur under normal operating conditions.
However, accelerated tests have often been conducted with out knowledge
of the failure mechanisms and without ensuring that the test accelerated
the same mechanism as that observed under normal operating conditions.
This paper summarizes common failure mechanisms in electronic devices and
packages and investigates possible failure mechanism shifting during accelerated
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