2nd ESA Electronic Components Conference, Noordwijk, The Netherlands, May 24-28, 1993.

Physics-of-Failure Based Computer Tools for the Design of Microelectronic Packages

P. Lall and E. Hakim


A physics-of-failure approach has been developed for reliability assessment of MCMs based on device architecture, environmental and test lads, and device mission life.  Some of the features of these software tools are discussed.

Complete article is available to CALCE Consortium Members.

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